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ID 30057
FullText URL
Author
Shimizu, Toshimi
Michinishi, Hiroyuki
Okamoto, Takuji
Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends

Keywords
combinational circuits
logic testing
matrix algebra
Note
Digital Object Identifier: 10.1109/ATS.1994.367218
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1994., Proceedings of the Third Asian, 15-17 Nov 2006, Pages 280-285.
Publisher URL:http://dx.doi.org/10.1109/ATS.1994.367218
Copyright © 1994 IEEE. All rights reserved.
Published Date
1994-11-15
Publication Title
Test Symposium
Start Page
280
End Page
285
Content Type
Journal Article
language
英語
Refereed
True
DOI
Submission Path
industrial_engineering/60