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Nakano, Masanori Okayama University
Nishimoto, Hidehiko Okayama University
Fujiwara, Koji Okayama University
Takahashi, Norio Okayama University
Due to structural limitation, the currently proposed apparatus based on a single sheet tester (SST) cannot measure magnetic properties along arbitrary directions (so-called 2-D magnetic properties) of silicon steel at high flux densities. In this paper, significant improvements are carried out on magnetizing windings and auxiliary yokes of a double excitation type of SST. Furthermore, crosswise overlapped H-coils are introduced so that even an ordinary single-excitation type of SST can be applicable to the measurements of 2-D properties. It is demonstrated that 2-D magnetization property up to 1.9 T can be measured by using the newly developed SST's
Crosswise overlapped H-coils
single sheet tester
2-D magnetic properties
Digital Object Identifier: 10.1109/20.800723
Published with permission from the copyright holder. This is the institute's copy, as published in Magnetics, IEEE Transactions on, Sept. 1999, Volume 35, Issue 5, Part 2, Pages 3965-3967.
Copyright © 1999 IEEE. All rights reserved.